I received his Ph.D. from the University of Marne-la-Vallée in 2001 and the Habilitation à Diriger des Recherches from the Université Paul Sabatier of Toulouse in 2014. I am currently researcher at CEA-DAM-Ile de France. My field of expertise is atomic scale simulation of materials and the studies of the impact of the point defects on materials properties, mainly related to microelectronic and optoelectronic technologies under radiation. I have participated in numerous studies on the simulation and characterization of defects in oxides and semiconductors, at oxide/oxide and oxide/semiconductor interfaces and their formation during manufacturing processes and under irradiation. I have authored or co-authored over 60 journal papers and I have been supervisor or co-supervisor of more than ten PhD and post-doctoral students.